Reduction of Light Scattering from Contamination by Thin Film Coating Design

Alexander von Finck; Yuan Wang; Sven Schröder; Steffen Wilbrandt; Olaf Stenzel; Angela Duparré

doi:10.1364/OIC.2016.TC.7

Optical Interference Coatings 2016
OSA Technical Digest (online) (Optica Publishing Group, 2016),
paper TC.7
•https://doi.org/10.1364/OIC.2016.TC.7

Reduction of Light Scattering from Contamination by Thin Film Coating Design

Alexander von Finck, Yuan Wang, Sven Schröder, Steffen Wilbrandt, Olaf Stenzel, and Angela Duparré

Optical Interference Coatings 2016

Tucson, Arizona United States
19–24 June 2016
ISBN: 978-1-943580-13-2

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OIC 2016 Design Problem Results and Coating Designs (TC)

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A. von Finck, Y. Wang, S. Schröder, S. Wilbrandt, O. Stenzel, and A. Duparré, "Reduction of Light Scattering from Contamination by Thin Film Coating Design," in Optical Interference Coatings 2016, OSA Technical Digest (online) (Optica Publishing Group, 2016), paper TC.7.

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Abstract

In most applications, contamination of optical thin film coatings is inevitable over time. We demonstrate that the coating design can be tailored to reduce light scattering arising from particle contamination.

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