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Conferences > OIC > 2016 > MB > MB.8

Measuring Low Absorption Losses in Coatings and Substrates by Laser Induced Deflection

Christian Mühlig and Simon Bublitz

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Abstract

An overview is given on the different concepts to absolutely measure very low absorption in optical materials and coating by using the laser induced deflection (LID) technique. Besides the individual pros and cons of the concepts we focus on the absolute calibration and the achievable sensitivity. In particular for the Sandwich-LID-concept experimental results are given that cover low loss materials and coatings in a wide wavelength range.

© 2016 Optical Society of America

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