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Negative Real Part of Equivalent Refractive Index of a Chevronic Nanostructured Film of Silver

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Abstract

In this paper, the chevronic silver film with thickness of 230±5 nm is fabricated using bideposition technique at the deposition angle of 86°. Chevronic silver film that consists of the top and bottom rods is deposited by rotating the substrate about its normal during the deposition. The equivalent refractive indices n and equivalent relative impedances η for p-polarized (the electric filed is parallel to the bottom rods) and s-polarized lights are measured by walk-off interferometer. The real part of the equivalent refractive index and the equivalent permeability of the film are negative at the wavelength of 639 nm.

© 2010 Optical Society of America

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