Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
Conferences > OIC > 2010 > ThE > ThE8

Speckle histograms for a direct determination of cross-correlation laws in the light scattering process of multilayer optics

Myriam ZERRAD, Jacques SORRENTINI, and Claude AMRA

Not Accessible

Your library or personal account may give you access

Abstract

A statistical study of speckle patterns emitted by multilayer coatings is related to thin films microstructure. Cross-correlation coefficients between interface roughnesses are extracted from the speckle histogram behaviour. The extraction and experimental procedure are immediate.

© 2010 Optical Society of America

PDF Article
More Like This
Scattering vs wavelength from multilayer coatings: influence of cross-correlation laws

C. Amra, C. Grezes-Besset, and E. Pelletier
FE8 OSA Annual Meeting (FIO) 1987

Interface roughness cross-correlation laws deduced from scattering diagram measurements on optical multilayers: effect of the material grain size

C. Amra, P. Roche, and Emile Pelletier
TUR1 OSA Annual Meeting (FIO) 1986

Surfaces cross-correlation in multilayers controls the polarization degree of low-level scattering

M. Zerrad, A. Ghabbach, G. Soriano, and C. Amra
ThC.8 Optical Interference Coatings (OIC) 2013

View More...
Select as filters
Select Topics Cancel
Top
       
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.
Privacy | Terms of Use