Analysis of Dip Coating Processing Parameters by Double Optical Monitoring

Flavio Horowitz; Alexandre F. Michels

doi:10.1364/OIC.2007.WC8

Optical Interference Coatings
OSA Technical Digest (CD) (Optica Publishing Group, 2007),
paper WC8
•https://doi.org/10.1364/OIC.2007.WC8

Analysis of Dip Coating Processing Parameters by Double Optical Monitoring

Flavio Horowitz and Alexandre F. Michels

Optical Interference Coatings 2007

Tucson, Arizona United States
3–8 June 2007
ISBN: 1-55752-841-1

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F. Horowitz and A. F. Michels, "Analysis of Dip Coating Processing Parameters by Double Optical Monitoring," in Optical Interference Coatings, OSA Technical Digest (CD) (Optica Publishing Group, 2007), paper WC8.

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Abstract

Double optical monitoring is applied to look into the influence of withdrawal speed, temperature and relative humidity in the formation of sulfated zirconia and mesoporous silica sol-gel films by dip coating in real time.

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