Abstract
The position shifts of the reflective beam, from the thin film filter have been investigated, as the change of incident light wavelength. Not only positive beam shift exits in the common superprism effect of thin film coatings, we have found that the negative beam shift is also exited in the thin films coatings. The mechanism of the spatial dispersion of the reflective light from the thin film F-P filter was analyzed, and the experimental results were used to prove them. The potential application of the negative and positive spatial dispersion is presented in the report.
© 2007 Optical Society of America
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