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Conferences > OIC > 2007 > TuC > TuC5

Influences of the incident angle, orientation of deposition plane and film thickness on a polarization conversion reflection filter

Cheng-Yu Peng, Yi-Jun Jen, and Kuen-Teng Shiu

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Abstract

This study presents the influences on a band-pass polarization conversion reflection filter. The wavelength spectrum of polarization conversion reflection can be modulated to shift by changing thickness, orientation of deposition plane of an anisotropic thin film, and the spectrum also shifts with the angle of incidence.

© 2007 Optical Society of America

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