Explicit refractive index determination from the envelopes of the ellipsometric magnitude tan(psi)

J. C. M. Anton

doi:10.1364/OIC.2007.ThA9

Optical Interference Coatings
OSA Technical Digest (CD) (Optica Publishing Group, 2007),
paper ThA9
•https://doi.org/10.1364/OIC.2007.ThA9

Explicit refractive index determination from the envelopes of the ellipsometric magnitude tan(psi)

J. C. M. Anton

Optical Interference Coatings 2007

Tucson, Arizona United States
3–8 June 2007
ISBN: 1-55752-841-1

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Measurements I (ThA)

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J. C. M. Anton, "Explicit refractive index determination from the envelopes of the ellipsometric magnitude tan(psi)," in Optical Interference Coatings, OSA Technical Digest (CD) (Optica Publishing Group, 2007), paper ThA9.

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Abstract

We present some explicit formulas that link the properties of the interfaces delimiting an interference film to the envelopes of measured tan(ψ). Constants estimation is direct, free from regression analysis, thickness estimation or dispersion models.

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