Improved Characterization of Optical Surfaces from Scattered Light Measurements

James E. Harvey; Andrey Krywonos

doi:10.1364/OIC.2007.ThA4

Optical Interference Coatings
OSA Technical Digest (CD) (Optica Publishing Group, 2007),
paper ThA4
•https://doi.org/10.1364/OIC.2007.ThA4

Improved Characterization of Optical Surfaces from Scattered Light Measurements

James E. Harvey and Andrey Krywonos

Optical Interference Coatings 2007

Tucson, Arizona United States
3–8 June 2007
ISBN: 1-55752-841-1

From the session
Measurements I (ThA)

Not Accessible

Your library or personal account may give you access

Get PDF
Email
Share
Get Citation
Copy Citation Text
J. E. Harvey and A. Krywonos, "Improved Characterization of Optical Surfaces from Scattered Light Measurements," in Optical Interference Coatings, OSA Technical Digest (CD) (Optica Publishing Group, 2007), paper ThA4.

Export Citation
- BibTex
- Endnote (RIS)
- HTML
- Plain Text
Citation alert
Save article

Abstract

A generalized surface scatter theory results in an improved solution to the inverse scattering problem. This new solution eliminates undesirable artifacts in the surface PSD function predicted from the classical Rayleigh-Rice theory.

PDF Article

More Like This

Predicting Image Degradation from Optical Surface Metrology Data

James E. Harvey, Narak Choi, Andrey Krywonos, and Gary Peterson
OMB2 Optical Fabrication and Testing (OF&T) 2010

Surface Characterization of High-End Optical Components using Light Scattering

Sven Schröder, Marcus Trost, Tobias Herffurth, Matthias Hauptvogel, Mikhail E. Sachkov, and Valeri G. Zhupanov
OW3B.6 Optical Fabrication and Testing (OF&T) 2017

“Just-Good-Enough” Optical Fabrication

James E. Harvey, Joshua Lentz, and Joseph B. Houston
OWA5 Optical Fabrication and Testing (OF&T) 2008

Previous Article Next Article