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High resolution photothermal microscope : A very sensitive tool for the detection of nano-scale isolated absorbing defects in optical coatings

Bertrand Bertussi, Mireille Commandré, and Jean-Yves Natoli

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Abstract

Photothermal deflection technique permits to highlight the presence of absorbing defects in optical components. This non-destructive tool is of a great interest to understand the role of impurities in laser-induced damage process. The detection of nano-sized isolated inclusions requieres to develop a very sensitive photothermal setup. Thus, it is essential to improve the detection up to its theoretical limit.

© 2004 Optical Society of America

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