Turning-point monitoring is not simply optical thickness compensation

Stéphane Larouche; Aram Amassian; Bill Baloukas; Ludvik Martinu

doi:10.1364/OIC.2004.TuE8

Optical Interference Coatings
OSA Technical Digest Series (Optica Publishing Group, 2004),
paper TuE8
•https://doi.org/10.1364/OIC.2004.TuE8

Turning-point monitoring is not simply optical thickness compensation

Stéphane Larouche, Aram Amassian, Bill Baloukas, and Ludvik Martinu

Optical Interference Coatings 2004

Tucson, Arizona United States
27 June–2 July 2004
ISBN: 3-5400-0364-9

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Monitoring (TuE)

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S. Larouche, A. Amassian, B. Baloukas, and L. Martinu, "Turning-point monitoring is not simply optical thickness compensation," in Optical Interference Coatings, OSA Technical Digest Series (Optica Publishing Group, 2004), paper TuE8.

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Abstract

Contrarily to widespread belief, turning-point monitoring entails more than simply optical thickness compensation. In fact, we demonstrate that optical thickness compensation is barely better than no correction at all for the fabrication of narrow-band filters.

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