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Conferences > OFT > 2021 > JTu2B > JTu2B.4

Enhanced Freeform Measurements by Use of a Scanning Multi-Wavelength Interferometer

Marc Wendel

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Abstract

A scanning point interferometer, basing on a multi-wavelength approach, is presented. Its capability and flexibility in freeform measurements is outlined, as well as recently improved measurement accuracy by a new calibration strategy.

© 2021 The Author(s)

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