Multi-Point Low-Coherence Optical Probe for Freeform Optical Metrology

Damon W. Diehl; Christopher T. Cotton; Christopher J. Ditchman; Nathan E. Burdick; Howard S. Ammenheuser

doi:10.1364/OFT.2010.OTuD3

International Optical Design Conference and Optical Fabrication and Testing
OSA Technical Digest (CD) (Optica Publishing Group, 2010),
paper OTuD3
•https://doi.org/10.1364/OFT.2010.OTuD3

Multi-Point Low-Coherence Optical Probe for Freeform Optical Metrology

Damon W. Diehl, Christopher T. Cotton, Christopher J. Ditchman, Nathan E. Burdick, and Howard S. Ammenheuser

Optical Fabrication and Testing 2010

Jackson Hole, Wyoming United States
13–17 June 2010
ISBN: 978-1-55752-893-3

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Freeform Optics (OTuD)

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D. W. Diehl, C. T. Cotton, C. J. Ditchman, N. E. Burdick, and H. S. Ammenheuser, "Multi-Point Low-Coherence Optical Probe for Freeform Optical Metrology," in International Optical Design Conference and Optical Fabrication and Testing , OSA Technical Digest (CD) (Optica Publishing Group, 2010), paper OTuD3.

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Abstract

We have developed a four-beam non-contact optical probe that uses low-coherence interferometry to measure the position and orientation of the interior and exterior surfaces of a freeform optic by scanning the probe over the object.

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