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Conferences > OFT > 2010 > OMA > OMA3
  • International Optical Design Conference and Optical Fabrication and Testing
  • OSA Technical Digest (CD) (Optica Publishing Group, 2010),
  • paper OMA3
  • •https://doi.org/10.1364/OFT.2010.OMA3

Diffraction Effects in Interferometry

Ping Zhou and James H. Burge

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Abstract

Besides the geometrical errors, interferometry suffers errors due to diffraction, because the wavefront aberrations of the test and reference beams change as they propagate. This paper addresses errors due to diffraction effects in interferometry.

© 2010 OSA, SPIE

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