Complex Surface Measurement by Non-Contact Probes

Scott DeFisher; Shai Shafrir

doi:10.1364/OFT.2010.JMB13

International Optical Design Conference and Optical Fabrication and Testing
OSA Technical Digest (CD) (Optica Publishing Group, 2010),
paper JMB13
•https://doi.org/10.1364/OFT.2010.JMB13

Complex Surface Measurement by Non-Contact Probes

Scott DeFisher and Shai Shafrir

Optical Fabrication and Testing 2010

Jackson Hole, Wyoming United States
13–17 June 2010
ISBN: 978-1-55752-893-3

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Joint IODC/OF&T Poster Session (JMB)

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S. DeFisher and S. Shafrir, "Complex Surface Measurement by Non-Contact Probes," in International Optical Design Conference and Optical Fabrication and Testing , OSA Technical Digest (CD) (Optica Publishing Group, 2010), paper JMB13.

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Abstract

UltraSurf is a five axis non-contact optical 3-D scanner for the measurement of complex optical surfaces. Interchangeable optical probes enable non-contact surface and thickness measurements of surfaces of ground or polished parts.

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