Optical test system for reflective electro-optical adaptive micro-device phase measurement

Dale E. Ewbank

doi:10.1364/OFT.2006.OFMC6

Frontiers in Optics
OSA Technical Digest (CD) (Optica Publishing Group, 2006),
paper OFMC6
•https://doi.org/10.1364/OFT.2006.OFMC6

Optical test system for reflective electro-optical adaptive micro-device phase measurement

Dale E. Ewbank

Optical Fabrication and Testing 2006

Rochester, New York United States
9–11 October 2006
ISBN: 1-55752-818-7

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OF&T Main Poster Session (OFMC)

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D. E. Ewbank, "Optical test system for reflective electro-optical adaptive micro-device phase measurement," in Frontiers in Optics, OSA Technical Digest (CD) (Optica Publishing Group, 2006), paper OFMC6.

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Abstract

A system to measure phase for reflective electro-optical micro-devices at visible wavelengths was developed. Relative phase versus voltage is required for control design of devices utilizing electro-optic materials such as polymer dispersed liquid crystals.

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