Optical Arbitrary Waveform Measurement (OAWM) on the Silicon Photonic Platform

Dengyang Fang; Andrea Zazzi; Juliana Müller; Daniel Drayß; Christoph Füllner; Pablo Marin-Palomo; Ali Tabatabaei Mashayekh; Arka Dipta Das; Maxim Weizel; Sergiy Gudyriev; Wolfgang Freude; Sebastian Randel; Christoph Scheytt; Jeremy Witzens; Christian Koos; Christian Koos

doi:10.1364/OFC.2021.F2E.6

Optical Fiber Communication Conference (OFC) 2021
OSA Technical Digest (Optica Publishing Group, 2021),
paper F2E.6
•https://doi.org/10.1364/OFC.2021.F2E.6

Optical Arbitrary Waveform Measurement (OAWM) on the Silicon Photonic Platform

Dengyang Fang, Andrea Zazzi, Juliana Müller, Daniel Drayß, Christoph Füllner, Pablo Marin-Palomo, Ali Tabatabaei Mashayekh, Arka Dipta Das, Maxim Weizel, Sergiy Gudyriev, Wolfgang Freude, Sebastian Randel, Christoph Scheytt, Jeremy Witzens, and Christian Koos

Optical Fiber Communication Conference 2021

Washington, DC United States
6–11 June 2021
ISBN: 978-1-943580-86-6

From the session
Quantum and Novel Subsystems (F2E)

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D. Fang, A. Zazzi, J. Müller, D. Drayß, C. Füllner, P. Marin-Palomo, A. T. Mashayekh, A. D. Das, M. Weizel, S. Gudyriev, W. Freude, S. Randel, C. Scheytt, J. Witzens, and C. Koos, "Optical Arbitrary Waveform Measurement (OAWM) on the Silicon Photonic Platform," in Optical Fiber Communication Conference (OFC) 2021, P. Dong, J. Kani, C. Xie, R. Casellas, C. Cole, and M. Li, eds., OSA Technical Digest (Optica Publishing Group, 2021), paper F2E.6.

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Abstract

We demonstrate optical arbitrary waveform measurement (OAWM) using a silicon pho-tonic spectral slicer. Exploiting maximal-ratio combining (MRC), we demonstrate the viability of the scheme by reconstructing 100-GBd 64QAM signals with high quality.

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Slice-Less Optical Arbitrary Waveform Measurement (OAWM) on a Silicon Photonic Chip

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