Abstract
Thin-film resonant cavity filters have been incorporated into passive wavelength-division multiplexing (WDM) components by a number of vendors. However, when conventional filter technology has been applied to narrow-band DWDM applications, several shortcomings become evident, such as poor temperature and environmental stability, high insertion loss, or poor bandpass spectral shape. Typically, these problems can be traced primarily to defects with film morphology such as: porosity, scatter, absorption, columnar structure, inhomogeneity, or lack of accurate thickness control.
© 1996 Optical Society of America
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