Abstract
A new edge-emitting LED (EELED) has been developed for optical low-coherence reflectometry (OLCR). OLCR is a technique that can measure extremely low reflection levels in optical fiber with a spatial resolution of tens of micrometers.1 The EELED features extremely low levels of reflection internal to the device simultaneously with high-output-power capability. High output power increases the sensitivity of reflection measurements. Low internal-reflection levels in the EELED suppress spurious responses in OLCR measurements.
© 1995 Optical Society of America
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