High-resolution reflectometry techniques for analysis of fiber subsystems and devices

Steven A. Newton

doi:10.1364/OFC.1994.WA1

Conference on Optical Fiber Communication
1994 OSA Technical Digest Series (Optica Publishing Group, 1994),
paper WA1
•https://doi.org/10.1364/OFC.1994.WA1

High-resolution reflectometry techniques for analysis of fiber subsystems and devices

Steven A. Newton

Optical Fiber Communication Conference 1994

San Jose, California United States
ISBN: 1-55752-331-2

From the session
Measurement Techniques and Polymer Waveguides (WA)

Not Accessible

Your library or personal account may give you access

Get PDF
Email
Share
Get Citation
Copy Citation Text
S. A. Newton, "High-resolution reflectometry techniques for analysis of fiber subsystems and devices," in Conference on Optical Fiber Communication, Vol. 4 of 1994 OSA Technical Digest Series (Optica Publishing Group, 1994), paper WA1.

Export Citation
- BibTex
- Endnote (RIS)
- HTML
- Plain Text
Citation alert
Save article

Abstract

Optical-reflectometry techniques are the primary measurement tools for single-ended characterization of fiber cables, subsystems, and components. Conventional optical time-domain reflectometry (OTDR) is the best known and most widely used of these techniques.

PDF Article

More Like This

Novel technique for all-haul optical time domain reflectometry using optical fiber amplifier and switches

Y. K. Chen and S. Chi
CThI40 Conference on Lasers and Electro-Optics (CLEO:S&I) 1994

High-resolution optical frequency domain reflectometry

David W. Dolfi
FC6 Optical Fiber Communication Conference (OFC) 1991

A Novel Optical Fiber Reflectometry Technique with High Spatial Resolution and Long Distance

Qingwen Liu, Li Liu, Xinyu Fan, Jiangbing Du, Lin Ma, and Zuyuan He
AW3I.2 Asia Communications and Photonics Conference (ACP) 2014

Previous Article Next Article