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Strong change in the carrier-induced refractive index of a semiconductor laser at low carrier densities

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Abstract

The carrier-induced index change is important for the design of modulators and for the analysis of frequency-chirping effects, spectral linewidth, and wavelength-tuning characteristics. Until recently, only the index change for injected carrier density just near lasing threshold (N ≥ 0.8Nth) was known.1 Thus the reported index change is valid only for carrier densities near Nth. Therefore a nonlinear relationship between index change and carrier density cannot be easily recognized for a small range of carrier density. In our previous publication,2 an injection-reflection technique for measuring the Fabry-Perot oscillation was combined with a differential carrier-lifetime measurement for determining the carrier-induced index change over a wider range of carrier density (2 × 1017 to 2 × 1013 cm-3).

© 1994 Optical Society of America

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