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Nondestructive evaluation of optical fiber splices and connectors

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Abstract

We have successfully used two nondestructive evaluation (NDE) techniques—microfocus x-ray imaging and gamma-radiography— with optical fiber splices and connectors for detecting defects and identifying failure mechanisms. Because there are few field failures, availability of samples for any postmortem analysis is limited. NDE requites no special preparation and offers the advantage of preserving the sample integrity. Its usefulness in analyzing field problems is demonstrated here through several examples, where failure analysis by conventional, destructive techniques was difficult.

© 1992 Optical Society of America

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