Abstract

Coherence-domain reflectometry (OCDR) is a white-light interferometric technique for detecting, quantifying, and localizing weakly reflecting irregularities in micro-optic components, fiber-optic devices, and integrated optical structures. Besides its ability to approach the quantum limit of detection, it has the potential of high spatial resolution in the micrometer range. The basic OCDR concept, however, can prevent neither a deterioration of spatial resolution from dispersion nor the occurrence of artifacts from nonideal source spectra. The former effect, which we have in view here, may progressively degrade the resolution by more than a factor of 10, even if the device under test is not longer than 1-2 cm.

© 1991 Optical Society of America