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Polarimetry-based far-field method for high-resolution optical microscopy

Oscar Rodríguez, David Lara, and Chris Dainty

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Abstract

We present numerical and experimental results of a polarimetry-based far-field method for high-resolution optical microscopy. This method may be used to differentiate between a set of different sub-resolution objects with no need for active scanning.

© 2011 Optical Society of America

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