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Conferences > NTM > 2011 > NMA > NMA6

Imaging Beyond the Diffraction Limit by Electron-Beam Excited Assisted (EXA) Scanning Optical Microscope

W. Inami, Y. Nawa, A. Chiba, A. Ono, A. Miyakawa, Y. Kawata, and S. Terakawa

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Abstract

We propose an electron-beam excited assisted (EXA) scanning optical microscope which has a few tens nanometer spatial resolution laterally and is possible to observe dynamic behaviors of living biological specimens in various surroundings such as air or liquids. A nanometric light source is excited by focused electron beam in a luminescent film. The EXA scanning optical microscope enables to observe optical constants such as absorption, refractive index, polarization properties, and its dynamic behaviors in nanometer scale.

© 2011 Optical Society of America

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