CMOS descanning and acousto-optic scanning enable faster confocal imaging

Dejan Vučinić; Yu M. Chi; Yu M. Chi; Martin W. Hetzer; Gert Cauwenberghs; Terrence J. Sejnowski; Terrence J. Sejnowski

doi:10.1364/NTM.2009.NWA6

Advances in Imaging
OSA Technical Digest (CD) (Optica Publishing Group, 2009),
paper NWA6
•https://doi.org/10.1364/NTM.2009.NWA6

CMOS descanning and acousto-optic scanning enable faster confocal imaging

Dejan Vučinić, Yu M. Chi, Martin W. Hetzer, Gert Cauwenberghs, and Terrence J. Sejnowski

Novel Techniques in Microscopy 2009

Vancouver Canada
26–30 April 2009
ISBN: 978-1-55752-871-1

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New Techniques I (NWA)

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D. Vučinić, Y. M. Chi, M. W. Hetzer, G. Cauwenberghs, and T. J. Sejnowski, "CMOS descanning and acousto-optic scanning enable faster confocal imaging," in Advances in Imaging, OSA Technical Digest (CD) (Optica Publishing Group, 2009), paper NWA6.

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Abstract

Fast pixel random access capabilities of CMOS imagers are exploited to create a virtual pinhole or slit in synchrony with acousto-optic laser beam scanning to significantly speed up confocal microscopy.

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