Author Affiliations

D. Duchesne,^(1),+ K. A. Rutkowska,^(1),* M. Volatier,⁽²⁾ F. Légaré,⁽¹⁾ S. Delprat,⁽¹⁾ M. Chaker,⁽¹⁾ D. Modotto,⁽³⁾ A. Locatelli,⁽³⁾ C. De Angelis,⁽³⁾ M. Sorel,⁽⁴⁾ D. N. Christodoulides,⁽⁵⁾ G. Salamo,⁽⁶⁾ R. Arès,⁽²⁾ V. Aimez,⁽²⁾ and R. Morandotti⁽¹⁾

⁽¹⁾INRS-EMT, 1650 Boulevard Lionel Boulet, Varennes, Québec, Canada, J3X 1S2

⁽²⁾Centre de Recherche en Nanofabrication et en Nanocaractérisation (CRN2), Université de Sherbrooke, Sherbrooke, Québec, Canada, J1K 2R1

⁽³⁾Dipartimento di Ingegneria dell'Informazione, Università di Brescia, via Branze 38, Brescia, Italy, 25123

⁽⁴⁾Department of Electrical and Electronic Engineering, University of Glasgow, Glasgow, Scotland, G12 8QQ

⁽⁵⁾College of Optics & Photonics-CREOL & FPCE, University of Central Florida, Orlando, Florida, 32816

⁽⁶⁾Dept. of Physics, University of Arkansas, Fayetteville, Arkansas, USA, 72701

^(*)Also with: Faculty of Physics, Warsaw University of Technology, Warsaw, Poland, PL-00662

⁺ david.duchesne@emt.inrs.ca