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Observing grain boundaries in monolayer molybdenum disulphide by multiphoton microscopy

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Abstract

Multiphoton microscopy is used to characterize the crystal orientations and grain boundaries of chemical vapor deposited monolayer molybdenum disulphide flakes. Third-harmonic generation is shown to be sensitive for grain boundaries regardless of the crystal mis-orientations.

© 2015 Optical Society of America

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