D4σ nonlinear measurement inside a 4f-Z-scan system

G. Boudebs; V. Besse; C. Cassagne; H. Leblond; Cid B. de Araújo

doi:10.1364/NLO.2013.NTu1B.5

Nonlinear Optics
OSA Technical Digest (online) (Optica Publishing Group, 2013),
paper NTu1B.5
•https://doi.org/10.1364/NLO.2013.NTu1B.5

D4σ nonlinear measurement inside a 4f-Z-scan system

G. Boudebs, V. Besse, C. Cassagne, H. Leblond, and Cid B. de Araújo

Nonlinear Optics 2013

Kohala Coast, Hawaii United States
21–26 July 2013
ISBN: 978-1-55752-977-0

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Nonlinear Techniques and Characterization (NTu1B)

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G. Boudebs, V. Besse, C. Cassagne, H. Leblond, and C. B. de Araújo, "D4σ nonlinear measurement inside a 4f-Z-scan system," in Nonlinear Optics, B. Boulanger, S. Cundiff, M. Kauranen, and W. Knox, eds., OSA Technical Digest (online) (Optica Publishing Group, 2013), paper NTu1B.5.

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Abstract

The D4σ method using a 4f-Z-scan system is presented in order to increase the sensitivity and the resolution in Z-scan measurements. The numerical calculations and the experimental results validate our approach.

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