Nonlinear Refraction of Semiconductor Quantum Dots Using Single Wavelength and White-Light Continuum Z-scan

Lazaro A. Padilha; Gero Nootz; Mihaela Balu; David J. Hagan; Eric W. Van Stryland

doi:10.1364/NLO.2007.MC5

Nonlinear Optics: Materials, Fundamentals and Applications
OSA Technical Digest (CD) (Optica Publishing Group, 2007),
paper MC5
•https://doi.org/10.1364/NLO.2007.MC5

Nonlinear Refraction of Semiconductor Quantum Dots Using Single Wavelength and White-Light Continuum Z-scan

Lazaro A. Padilha, Gero Nootz, Mihaela Balu, David J. Hagan, and Eric W. Van Stryland

Nonlinear Optics: Materials, Fundamentals and Applications 2007

Kona, Hawaii United States
ISBN: 1-55752-843-8

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Nonlinear Optics in Novel Structures I (MC)

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L. A. Padilha, G. Nootz, M. Balu, D. J. Hagan, and E. W. Van Stryland, "Nonlinear Refraction of Semiconductor Quantum Dots Using Single Wavelength and White-Light Continuum Z-scan," in Nonlinear Optics: Materials, Fundamentals and Applications, OSA Technical Digest (CD) (Optica Publishing Group, 2007), paper MC5.

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Abstract

The nonlinear refractive index is measured in semiconductor quantum-dots using white light continuum Z-scan, which can measure nonlinear refraction as small as 10⁻¹⁶cm²/GW. The magnitude of the nonlinearity decreases for smaller quantum-dots.

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