Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Probing Electric Fields in Semiconductor Devices using Electric Field Induced Second Harmonic Generation

Not Accessible

Your library or personal account may give you access

Abstract

We observe electric field induced second harmonic generation in a GaN based UV diode laser. The scattered second harmonic is collected and measured as a function of bias voltage and incident laser power.

© 2000 Optical Society of America

PDF Article
More Like This
Probing Voltage Waveforms in Semiconductor Devices Using Electric Reid Induced Second Harmonic Generation

Daniel J. Kane and Kristen A. Peterson
CWA51 Conference on Lasers and Electro-Optics (CLEO:S&I) 2002

Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation

Euan Ramsay, Dong Xiao, Derryck T. Reid, Bernd Offenbeck, Jan Sundermeyer, Kay Seemann, and Norbert Weber
JTuC13 Conference on Lasers and Electro-Optics (CLEO:S&I) 2005

Electric-field-induced second-harmonic generation microscopy

Jesse D. Canterbury, Philip T. Wilson, and Michael C. Downer
CTuJ1 Conference on Lasers and Electro-Optics (CLEO:S&I) 2000

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.