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Electronic structure and ultrafast charge carrier dynamics of Zn clusters supported on a p-Si(100) surface

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Abstract

Femtosecond XUV photoemission spectroscopy is employed to monitor the non-metal to metal transition of Zn clusters grown on p-Si(100) as well as the ultrafast charge migration, trapping, and recombination at the surface.

© 2017 Optical Society of America

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