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Conferences > LS > 2017 > JW4A > JW4A.66

Near-field absorption imaging by two color Raman nano-light source

Ryo Kato, Yuika Saito, Takayuki Umakoshi, and Prabhat Verma

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Abstract

We demonstrate a new nano-imaging technique for intrinsic absorption properties of materials using aperture-less near-field scanning optical microscopy (NSOM). Raman scattering of silicon from the apex of a silicon nano-tip was utilized as the probe light for nano-scale absorption analysis without far-field background signal, which is one of the problems in ordinary NSOM.

© 2017 Optical Society of America

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