Refraction poses a problem in digital holographic microscopy for samples with a high numerical aperture (NA). We present raytracing and acquisition close to the image plane to enable refraction corrected phase imaging of such samples.

© 2016 Optical Society of America

PDF Article


You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
Login to access OSA Member Subscription