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  • JSAP-OSA Joint Symposia 2016 Abstracts
  • (Optica Publishing Group, 2016),
  • paper 14a_C302_6

Plasmon-Induced Charge Separation: Fundamentals and Applications

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Abstract

Plasmonic nanoparticles in contact with semiconductor exhibit plasmon-induced charge separation (PICS) under visible and near infrared light.1 PICS is based on carrier transfer from plasmonic nanoparticles to semiconductor1,2 due to external photoelectric effect, hot carrier injection, or interfacial electron transition. The most typical system exhibiting PICS consists of Au nanoparticle and TiO2. We observed electron injection from a single Au nanoplate to Nb-doped TiO2 in contact, by means of Kelvin probe force microscopy (KFM).2 Information about the cathodic and anodic potentials are important for designing PICS-based devices and materials. At open circuit, the cathodic potential of the Au-TiO2 system is around the flat-band potential Efb of TiO2. However, direct measurement of the anodic potential is difficult. We therefore measured it indirectly on the basis of chemical reactions such as ligand-assisted oxidative dissolution and surface hydroxylation of Au nanoparticles and concluded that the anodic potential is around Efb + (Fig. 1).3

© 2016 Japan Society of Applied Physics, Optical Society of America

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