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Conferences > ISA > 2014 > IW4C > IW4C.4

Enhanced Extended Depth-of-Field Microscopy via modeling of SLM effects on the applied phase mask

Md Shohag Hossain, Sharon V. King, and Chrysanthe Preza

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Abstract

To represent the imaging model precisely for wavefront encoded systems, we modified our forward model to take into consideration the diffraction inefficiency of spatial light modulator response and its effect on the ideal phase mask.

© 2014 Optical Society of America

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