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The coherent phonons are detected through the oscillation of transient reflection or transmission of the probe pulse as a function of the delay τ after the pump pulse[1]. Usually, only the integrated intensity of the reflected or transmitted probe pulse is measured. Recently, Mizoguchi et al.[2] performed systematic measurements of the frequency-resolved reflection spectra for CdTe crystal. In their experiment, the reflection change induced by the coherent phonon generated by a femto second pulse was measured as a function of the delay τ, the central frequency Ω1 of the probe pulse, and the detection frequency Ω2 as ΔR(τ,Ω1,Ω2)/R0 (R0 is the unperturbed reflection). This revealed Ω1 dependent peculiar behaviors.
© 2013 IEEE
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