High-Resolution Imaging of Trapped Ions for Scalable Quantum Computing

A. Jechow; E. W. Streed; B. G. Norton; M.J. Petrasiunas; D. Kielpinski

Proceedings of the International Quantum Electronics Conference and Conference on Lasers and Electro-Optics Pacific Rim 2011
(Optica Publishing Group, 2011),
paper I250

High-Resolution Imaging of Trapped Ions for Scalable Quantum Computing

A. Jechow, E. W. Streed, B. G. Norton, M.J. Petrasiunas, and D. Kielpinski

International Quantum Electronics Conference 2011

Sydney Australia
28 August–1 September 2011
ISBN: 978-0-9775657-7-1

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Session 4: Symposium 7 - Quantum Information 1 (QI1)

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A. Jechow, E. W. Streed, B. G. Norton, M. J. Petrasiunas, and D. Kielpinski, "High-Resolution Imaging of Trapped Ions for Scalable Quantum Computing," in Proceedings of the International Quantum Electronics Conference and Conference on Lasers and Electro-Optics Pacific Rim 2011, (Optica Publishing Group, 2011), paper I250.

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Abstract

A microfabricated phase Fresnel lens was used to image trapped ytterbium ions. This scalable architecture yields ion spot sizes of 440nm (FWHM), the highest imaging resolution ever achieved with an atom in free space.

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