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Conferences > IQEC > 2009 > JTuD > JTuD58
  • Conference on Lasers and Electro-Optics/International Quantum Electronics Conference
  • OSA Technical Digest (CD) (Optica Publishing Group, 2009),
  • paper JTuD58
  • •https://doi.org/10.1364/CLEO.2009.JTuD58

Photon-counting photobleaching measurements and the effect of dispersion in two-photon microscopy

Jeffrey J. Field, Ramón Carriles, and Jeff A. Squier

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Abstract

The effect of dispersion of the excitation pulse in two-photon microscopy is examined with a photon-counting microscope in both stationary and scanning modalitites, and it is demonstrated that transform-limited pulses provide the best signal yield despite increased bleaching rates.

© 2009 Optical Society of America

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