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Optica Publishing Group
  • International Quantum Electronics Conference
  • OSA Technical Digest (Optica Publishing Group, 1994),
  • paper QWC28

Measurement and numerical simulation of light localization in a disordered multilayer

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Abstract

Layers of antimonous sulfide and chiocite are alternately coated on the glass substrate. Their relative refractive index is nb/na = 2.1 in the wavelength range of 0.6–1.2 μm. The thicknesses am of all chiocite layers are the same, i.e., am = 〈a〉 = d/4na whereas those of Sb2S3 have a random distribution around the average value 〈b〉 = d/4nb, where d = 650 nm. The degree of disorder D is given by D = db/(〈a〉 + 〈b〉), where db is the average fluctuation of the thicknesses of the Sb2S3 layers and is expressed by (db)2 = [∑m(bm − 〈b〉)2]/m, where 〈a〉 + 〈b〉 is the average period length of multilayer. To observe the dependence of light transmissivity on the multilayer's length, we fabricated three kinds of multilayer. They all had the same D = 0.16, but their lengths varied as L = 10, 15, and 21 (in units of (a) + (b)), respectively.

© 1994 Optical Society of America

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