Abstract

Recently, the importance of the so-called excitation-induced dephasing (EID) effects for the understanding of four-wave-mixing signals has been discussed.¹ In its simplest formulation this effect means that the effective dephasing time T₂ of the excitonic resonance, which is measured in a four- wave-mixing experiment, depends on the intensity of the excitation light pulses. This phenomenon causes, for example, a coupling of the two spin-degenerate heavy-hole excitons in a strained GaAs Sample. Whereas the general consequences of EID can be described within a partly phenomenological approach, a fully systematic microscopic approach is highly desirable.

© 1994 Optical Society of America