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  • International Quantum Electronics Conference
  • OSA Technical Digest (Optica Publishing Group, 1987),
  • paper TUAA2

Optical constants of liquid silicon after picosecond laser illumination

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Abstract

The optical constants of molten silicon are not as well known as those of solid silicon. We are aware of one cw ellipsometric measurement of the dielectric function for molten Si around the visible1 and 1-ns time-resolved ellipsometric measurement of at 633 nm during pulsed excimer laser irradiation.2 With shorter pulses, there should be no problem associated with surface contamination, and it may even be possible to measure during superheating.

© 1987 Optical Society of America

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