Nonlinear optics in high-Q SOI optical microcavities

Matthew Borselli; Thomas J. Johnson; Oskar Painter

doi:10.1364/IPRA.2005.ITuC3

Integrated Photonics Research and Applications/Nanophotonics for Information Systems
Technical Digest (Optica Publishing Group, 2005),
paper ITuC3
•https://doi.org/10.1364/IPRA.2005.ITuC3

Nonlinear optics in high-Q SOI optical microcavities

Matthew Borselli, Thomas J. Johnson, and Oskar Painter

Integrated Photonics Research and Applications 2005

San Diego, California United States
10–13 April 2005
ISBN: 1-55752-787-3

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Nanophotonics (ITuC)

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M. Borselli, T. J. Johnson, and O. Painter, "Nonlinear optics in high-Q SOI optical microcavities," in Integrated Photonics Research and Applications/Nanophotonics for Information Systems, Technical Digest (Optica Publishing Group, 2005), paper ITuC3.

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Abstract

High-quality-factor (Q > 10⁶) silicon optical microdisks are fabricated out of silicon-on-insulator wafers. Optical loss mechanisms are characterized through fiber-taper-probe measurements. Nonlinear effects including Raman and Brillouin scattering, and thermal and free-carrier driven optical bistability are presented.

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