Abstract
Optical second harmonic generation in dense wavelength division multiplexing was used to monitor the performance of each channel in all dense wavelength division multiplexing (DWDM) optical networks. A poled Lithium-Niobate (PP-LNO3) device is used to convert C and L-band optical DWDM channels into half wavelength channels where silicon arrayed detectors and CMOS electronics were used to perform advanced digital signal processing to predict the optical channel presence, channel power, signal to noise ratio and the quality factor (Q) parameter. With further processing, the bit error rate per channel can be estimated from the Q factor. The technique is realized on a system-on-a-chip CMOS technology which can potentially lower the cost and improve the transparency of optical networking architectures.
© 2005 Optical Society of America
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