Abstract

Monolithic integration of an external modularor with a DFB or DBR laser has been widely investigated for use in high-speed lightwave transmitters [ 1-41. The laser-modulator chip represents a very simple, yet practically important, photonic integrated circuit, In this paper, we report a monolithic detector-DFB laser-electroabsorption modulator chip. By adding the detector to the integrated device, we have demonstrated on-wafer testing of the L-I characteristics of DFB lasers. This all-electrical, on-wafer testing of DFB lasers is relatively simple compared to the wafer testing of Fabry-Perot lasers reported previously [5]. After individual chips are cleaved from the wafer, the detector serves as a power monitor, which may be necessary for practical laser-modulator transmitters in the future. This photonic circuit was grown by metal organic vapor phase epitaxy (MOVPE).

© 1994 Optical Society of America