Abstract
The knowledge of the field distribution is important for characterizing buried optical waveguides. In order to obtain a high spatial resolution avoiding non-linear distortion, we use a scanning transverse offset technique, which can easily be applied to waveguides of different materials and dimensions. Results obtained by the application to buried rectangular waveguides based on InP [1] are compared with numerically simulated mode fields.
© 1994 Optical Society of America
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