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Conferences > IPR > 1994 > SaA > SaA3

Packaging Reliability Issues for Optoelectronic Sources: Status of Technology

J. L. Spencer, P. Su, L. F. DeChiaro, and M. P. Dugan

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Abstract

In analogy with the history of silicon integrated circuits, the reliability of optoelectronic sources has progressed through several improvement cycles over the past 15-20 years. Initially, optical sources using semiconductor lasers and light emitting diodes (LEDs) were subject to failures associated most often with the chips.

© 1994 Optical Society of America

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