Abstract

Accurate simulation of transient electrical behavior of heterojunction optoelectronic devices under realistic operating conditions is becoming an increasingly important concern in Optoelectronic Integrated Circuit (OEIC) design and optimization. We describe a method for simulating the OEICs, which may involve common electronic devices with well-established lumped element representations as well as heterojunction optoelectronic devices which require device level analysis, in a single simulation environment.

© 1994 Optical Society of America