Ray Tracing in Biaxial Materials

Wai Sze T. Lam; Stephen McClain; Gregory Smith; Russell Chipman

doi:10.1364/IODC.2010.IWA1

International Optical Design Conference and Optical Fabrication and Testing
OSA Technical Digest (CD) (Optica Publishing Group, 2010),
paper IWA1
•https://doi.org/10.1364/IODC.2010.IWA1

Ray Tracing in Biaxial Materials

Wai Sze T. Lam, Stephen McClain, Gregory Smith, and Russell Chipman

International Optical Design Conference 2010

Jackson Hole, Wyoming United States
13–17 June 2010
ISBN: 978-1-55752-893-3

From the session
Polarization in Optical Design (IWA)

Not Accessible

Your library or personal account may give you access

Get PDF
Email
Share
Get Citation
Copy Citation Text
W. S. T. Lam, S. McClain, G. Smith, and R. Chipman, "Ray Tracing in Biaxial Materials," in International Optical Design Conference and Optical Fabrication and Testing , OSA Technical Digest (CD) (Optica Publishing Group, 2010), paper IWA1.

Export Citation
- BibTex
- Endnote (RIS)
- HTML
- Plain Text
Citation alert
Save article

Abstract

Algorithms for polarization ray tracing biaxial materials and calculating the directions of ray propagation and energy flow, the refractive indices, and the coupling coefficients for all four resultant reflected and transmitted rays are presented.

PDF Article

More Like This

Challenges in Polarization Ray Tracing

Russell A. Chipman
IWA4 International Optical Design Conference (IODC) 2010

Birefringent Polarization Ray Tracing

Stephen C. McClain and Russell A. Chipman
WA.5 Optical Design for Photonics (ODP) 1993

Three-dimensional Polarization Ray Tracing and Diattenuation Calculation

Garam Yun, Karlton Crabtree, and Russell A. Chipman
JMB29 International Optical Design Conference (IODC) 2010

Previous Article Next Article