Abstract

CEP drift of ultrashort pulses originating solely from an amplifier is measured. The CEP noise in water cooled amplifiers has thermal origin, while it is induced by the inherent vibration of Ti:Sa upon cryogenical cooling.

© 2016 Optical Society of America

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More Like This
Carrier-Envelope Phase Noise Increment Due to Thermal Issues of a Ti:Sapphire-Based Amplifier

A. Börzsönyi, R. S. Nagymihály, P. Jójárt, and K. Osvay
JTh2A.18 Advanced Solid State Lasers (ASSL) 2013

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JTh2A.15 CLEO: QELS_Fundamental Science (CLEO_QELS) 2013

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